Hardware and Software, Verification and Testing
Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007, Proceedings
Yorav, Karen (EDT)
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MORE BOOK INFO
ISBN: 3540779647
Dewey Decimal: 005
Book Publisher: Springer-Verlag New York Inc
Language: ENG
No. of Pages: 266
