Verification, Model Checking, and Abstract Interpretation
9th International Conference, VMCAI 2008, San Francisco, USA, January 7-9, 2008, Proceedings
Logozzo, Francesco (EDT)
Peled, Doron A. (EDT)
Zuck, Lenore D. (EDT)
Paperback
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MORE BOOK INFO
ISBN: 3540781625
Dewey Decimal: 621
Library of Congress: 2008921735
Book Publisher: Springer-Verlag New York Inc
Language: ENG
No. of Pages: 323
